Color influence on accuracy of 3D scanners based on structured light

Sophie Voisin, David L. Page, Sebti Foufou, Frédéric Truchetet, Mongi A. Abidi

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

8 Scopus citations

Abstract

The characterization of commercial 3D scanners allows acquiring precise and useful data. The accuracy of range and, more recently, color for 3D scanners is usually studied separately, but when the 3D scanner is based on structured light with a color coding pattern, color influence on range accuracy should be investigated. The commercial product that we have tested has the particularity that it can acquire data under ambient light instead of a controlled environment as it is with most available scanners. Therefore, based on related work in the literature and on experiments we have done on a variety of standard illuminants, we have designed an interesting setup to control illuminant interference. Basically, the setup consists of acquiring the well-known Macbeth ColorChecker under a controlled environment and also ambient daylight. The results have shown variations with respect to the color. We have performed several statistical studies to show how the range results evolve with respect to the RGB and the HSV channels. In addition, a systematic noise error has also been identified. This noise depends on the object color. A subset of colors shows strong noise errors while other colors have minimal or even no systematic error under the same illuminant.

Original languageEnglish
Title of host publicationMachine Vision Applications in Industrial Inspection XIV - Proceedings of SPIE-IS and T Electronic Imaging
DOIs
StatePublished - 2006
Externally publishedYes
EventMachine Vision Applications in Industrial Inspection XIV - San Jose, CA, United States
Duration: Jan 16 2006Jan 17 2006

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume6070
ISSN (Print)0277-786X

Conference

ConferenceMachine Vision Applications in Industrial Inspection XIV
Country/TerritoryUnited States
CitySan Jose, CA
Period01/16/0601/17/06

Keywords

  • 3D Scanner
  • Color
  • Range Characterization
  • Structured Light

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