CMOS readout system for a double-sided germanium strip detector

R. A. Kroeger, W. N. Johnson, J. D. Kurfess, W. G. Schwarz, M. E. Read, M. D. Allen, G. T. Alley, C. L. Britton, L. C. Clonts, M. N. Ericson, M. L. Simpson

Research output: Contribution to conferencePaperpeer-review

Abstract

A wide variety of applications require a hard X-ray or gamma ray detector which combine both good spatial resolution and energy resolution. Double-sided solid-state strip detectors provide this capability. We report on the development of CMOS electronics designed for photon detection with strip detectors. These electronics include a low noise preamplifier, semi-gaussian shaping amplifier, discriminator, and peak detection circuitry. All circuits are designed to operate at low power. Circuits have been duplicated in both NMOS and PMOS to provide both polarities of signals. We have constructed an 8×8 channel system to test these prototype chips. Power consumption for the preamplifier through peak-detector circuit is 4 mW/channel. The test system has a conversion gain of approximately 35 mV/fC, system noise (equivalent noise charge) of ENC<220 e rms (0 pF), and a dynamic range of >100:1 in both NMOS and PMOS circuits.

Original languageEnglish
Pages691-693
Number of pages3
StatePublished - 1997
Externally publishedYes
EventProceedings of the 1997 IEEE Nuclear Science Symposium - Albuquerque, NM, USA
Duration: Nov 9 1997Nov 15 1997

Conference

ConferenceProceedings of the 1997 IEEE Nuclear Science Symposium
CityAlbuquerque, NM, USA
Period11/9/9711/15/97

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