Chemical State Evolution in Ferroelectric Films during Tip-Induced Polarization and Electroresistive Switching

Anton V. Ievlev, Petro Maksymovych, Morgan Trassin, Jan Seidel, Ramamoorthy Ramesh, Sergei V. Kalinin, Olga S. Ovchinnikova

Research output: Contribution to journalArticlepeer-review

31 Scopus citations

Abstract

Domain formation and ferroelectric switching is fundamentally inseparable from polarization screening, which on free surfaces can be realized via band bending and ionic adsorption. In the latter case, polarization switching is intrinsically coupled to the surface electrochemical phenomena, and the electrochemical stage can control kinetics and induce long-range interactions. However, despite extensive evidence toward the critical role of surface electrochemistry, little is known about the nature of the associated processes. Here we combine SPM tip induce polarization switching and secondary ion mass spectrometry to explore the evolution of chemical state of ferroelectric during switching. Surprisingly, we find that even pristine surfaces contain ions (e.g., Cl-) that are not anticipated based on chemistry of the system and processing. In the ferroelectric switching regime, we find surprising changes in surface chemistry, including redistribution of base cations. At higher voltages in the electroforming regime significant surface deformation was observed and associated with a strong ion intermixing.

Original languageEnglish
Pages (from-to)29588-29593
Number of pages6
JournalACS Applied Materials and Interfaces
Volume8
Issue number43
DOIs
StatePublished - Nov 2 2016

Funding

This material is based upon work supported by the U.S. Department of Energy, Office of Science, Office of Basic Energy Sciences under contract number DE-AC05-00OR22725.

FundersFunder number
Office of Basic Energy SciencesDE-AC05-00OR22725
U.S. Department of Energy
Office of Science

    Keywords

    • atomic force microscopy
    • chemical phenomena
    • ferroelectric thin film
    • ion intermixing
    • polarization switching
    • time-of-flight secondary ion mass spectrometry

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