Chemical solution deposition of lanthanum zirconate buffer layers on biaxially textured Ni-1.7% Fe-3% W alloy substrates for coated-conductor fabrication

S. Sathyamurthy; M. Paranthaman; T. Aytug; B. W. Kang; P. M. Martin; A. Goyal; D. M. Kroeger; D. K. Christen

doi:10.1557/JMR.2002.0229

Chemical solution deposition of lanthanum zirconate buffer layers on biaxially textured Ni-1.7% Fe-3% W alloy substrates for coated-conductor fabrication

S. Sathyamurthy, M. Paranthaman, T. Aytug, B. W. Kang, P. M. Martin, A. Goyal, D. M. Kroeger, D. K. Christen

Nanomaterials Chemistry Group

Research output: Contribution to journal › Article › peer-review

43 Scopus citations

Abstract

Sol-gel processing of La₂Zr₂O₇ (LZO) buffer layers on biaxially textured Ni-1.7% Fe-3% W alloy substrates using a continuous reel-to-reel dip-coating unit has been studied. The epitaxial LZO films obtained have a strong cube texture and uniform microstructure. The effects of increasing the annealing speed on the texture, microstructure, and carbon content retained in the film were studied. On top of the LZO films, epitaxial layers of yttria-stabilized zirconia and Ceria (CeO₂) were deposited using rf sputtering, and YBa₂CU₃O_x (YBCO) film were then deposited using pulsed laser deposition. Critical current densities (J_c) of 1.9 MA/cm² at 77 K and self-field and 0.34 MA/cm² at 77 K and 0.5 T have been obtained on these films. These values are comparable to those obtained on YBCO films deposited on all-vacuum deposited buffer layers and the highest ever obtained using solution seed layers.

Original language	English
Pages (from-to)	1543-1549
Number of pages	7
Journal	Journal of Materials Research
Volume	17
Issue number	6
DOIs	https://doi.org/10.1557/JMR.2002.0229
State	Published - Jun 2002

Funding

This research was sponsored by the United States Department of Energy, Division of Materials Sciences, Office of Science and Office of Power Technologies-Superconductivity Program and Office of Energy Efficiency and Renewable Energy. This research was performed at the Oak Ridge National Laboratory, managed by UT-Battelle, LLC, for the U.S.DOE under Contract DE-AC05-00OR22725. Sincere acknowledgments also extended to oak Ridge Associated Universities for making this work possible.

Funders	Funder number
Division of Materials Sciences
U.S.DOE	DE-AC05-00OR22725
U.S. Department of Energy
Office of Energy Efficiency and Renewable Energy
Oak Ridge National Laboratory

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title = "Chemical solution deposition of lanthanum zirconate buffer layers on biaxially textured Ni-1.7% Fe-3% W alloy substrates for coated-conductor fabrication",

abstract = "Sol-gel processing of La2Zr2O7 (LZO) buffer layers on biaxially textured Ni-1.7% Fe-3% W alloy substrates using a continuous reel-to-reel dip-coating unit has been studied. The epitaxial LZO films obtained have a strong cube texture and uniform microstructure. The effects of increasing the annealing speed on the texture, microstructure, and carbon content retained in the film were studied. On top of the LZO films, epitaxial layers of yttria-stabilized zirconia and Ceria (CeO2) were deposited using rf sputtering, and YBa2CU3Ox (YBCO) film were then deposited using pulsed laser deposition. Critical current densities (Jc) of 1.9 MA/cm2 at 77 K and self-field and 0.34 MA/cm2 at 77 K and 0.5 T have been obtained on these films. These values are comparable to those obtained on YBCO films deposited on all-vacuum deposited buffer layers and the highest ever obtained using solution seed layers.",

author = "S. Sathyamurthy and M. Paranthaman and T. Aytug and Kang, {B. W.} and Martin, {P. M.} and A. Goyal and Kroeger, {D. M.} and Christen, {D. K.}",

year = "2002",

month = jun,

doi = "10.1557/JMR.2002.0229",

language = "English",

volume = "17",

pages = "1543--1549",

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T1 - Chemical solution deposition of lanthanum zirconate buffer layers on biaxially textured Ni-1.7% Fe-3% W alloy substrates for coated-conductor fabrication

AU - Sathyamurthy, S.

AU - Paranthaman, M.

AU - Aytug, T.

AU - Kang, B. W.

AU - Martin, P. M.

AU - Goyal, A.

AU - Kroeger, D. M.

AU - Christen, D. K.

PY - 2002/6

Y1 - 2002/6

N2 - Sol-gel processing of La2Zr2O7 (LZO) buffer layers on biaxially textured Ni-1.7% Fe-3% W alloy substrates using a continuous reel-to-reel dip-coating unit has been studied. The epitaxial LZO films obtained have a strong cube texture and uniform microstructure. The effects of increasing the annealing speed on the texture, microstructure, and carbon content retained in the film were studied. On top of the LZO films, epitaxial layers of yttria-stabilized zirconia and Ceria (CeO2) were deposited using rf sputtering, and YBa2CU3Ox (YBCO) film were then deposited using pulsed laser deposition. Critical current densities (Jc) of 1.9 MA/cm2 at 77 K and self-field and 0.34 MA/cm2 at 77 K and 0.5 T have been obtained on these films. These values are comparable to those obtained on YBCO films deposited on all-vacuum deposited buffer layers and the highest ever obtained using solution seed layers.

AB - Sol-gel processing of La2Zr2O7 (LZO) buffer layers on biaxially textured Ni-1.7% Fe-3% W alloy substrates using a continuous reel-to-reel dip-coating unit has been studied. The epitaxial LZO films obtained have a strong cube texture and uniform microstructure. The effects of increasing the annealing speed on the texture, microstructure, and carbon content retained in the film were studied. On top of the LZO films, epitaxial layers of yttria-stabilized zirconia and Ceria (CeO2) were deposited using rf sputtering, and YBa2CU3Ox (YBCO) film were then deposited using pulsed laser deposition. Critical current densities (Jc) of 1.9 MA/cm2 at 77 K and self-field and 0.34 MA/cm2 at 77 K and 0.5 T have been obtained on these films. These values are comparable to those obtained on YBCO films deposited on all-vacuum deposited buffer layers and the highest ever obtained using solution seed layers.

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Chemical solution deposition of lanthanum zirconate buffer layers on biaxially textured Ni-1.7% Fe-3% W alloy substrates for coated-conductor fabrication

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