Charge injection in vertically stacked multi-layer black phosphorus

Sruthi Kuriakose, Rama Vasudevan, Taimur Ahmed, Chenglong Xu, Sharath Sriram, Madhu Bhaskaran, Sivacarendran Balendhran, Sumeet Walia

Research output: Contribution to journalArticlepeer-review

1 Scopus citations

Abstract

The efficiency of any electronic device is highly reliant on the charge-injection efficiency at the electrical contact and semiconductor interface. Black phosphorus (BP), a layered and highly anisotropic material is attractive for a variety of electronic and optoelectronic applications including vertically stacked devices with distinct top and bottom electrodes. This makes it imperative to ascertain the influence of contact materials on the charge injection in the out-of-plane configuration. Here, we explore four different contact materials (aluminium, ITO, gold and platinum) chosen based on their work functions relative to the chemical potential of BP. By monitoring the current-voltage characteristics in the out-of-plane direction, conclusions are drawn regarding the charge injection capabilities of these contact materials providing the base knowledge to design efficient BP based stacked devices.

Original languageEnglish
Article number100481
JournalApplied Materials Today
Volume18
DOIs
StatePublished - Mar 2020

Funding

A portion of this research was conducted at the Center for Nanophase Materials Sciences, which is a US DOE Office of Science User Facility (RKV). Scholarship support from the Research Training Program (RTP) scheme of the Australian government is acknowledged (SK). We also acknowledge equipment funding from the Australian Research Council through LE150100001 and the facilities and technical support from the RMIT Microscopy and Microanalysis Facility, a node of Microscopy Australia . This work is performed in part at the Micro Nano Research Facility at RMIT University in the Victorian Node of the Australian National Fabrication Facility (ANFF). A portion of this research was conducted at the Center for Nanophase Materials Sciences, which is a US DOE Office of Science User Facility (RKV). Scholarship support from the Research Training Program (RTP) scheme of the Australian government is acknowledged (SK). We also acknowledge equipment funding from the Australian Research Council through LE150100001 and the facilities and technical support from the RMIT Microscopy and Microanalysis Facility, a node of Microscopy Australia. This work is performed in part at the Micro Nano Research Facility at RMIT University in the Victorian Node of the Australian National Fabrication Facility (ANFF).

Keywords

  • Anisotropy
  • Black phosphorus
  • Electrical contacts
  • Stacked devices

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