Charge carrier diffusion length determination in 4H-SiC schottky alpha detectors

Research output: Contribution to journal › Conference article › peer-review

Original language	English
Pages (from-to)	175-177
Number of pages	3
Journal	Transactions of the American Nuclear Society
Volume	114
Issue number	1
State	Published - 2016
Externally published	Yes
Event	2016 Transactions of the American Nuclear Society Annual Meeting, ANS 2016 - New Orleans, United States Duration: Jun 12 2016 → Jun 16 2016

This research is being performed using funding received from the DOE Office of Nuclear Energy's Nuclear Energy University Programs.

Cite this

@article{835b80494690450da86556f97a595132,

title = "Charge carrier diffusion length determination in 4H-SiC schottky alpha detectors",

author = "Joshua Jarrell and Benjamin Reinke and Max Chaiken and Brandon Wilson and Wolfgang Windl and Bryan Esser and Lei Cao and Thomas Blue",

year = "2016",

language = "English",

volume = "114",

pages = "175--177",

journal = "Transactions of the American Nuclear Society",

issn = "0003-018X",

number = "1",

note = "2016 Transactions of the American Nuclear Society Annual Meeting, ANS 2016 ; Conference date: 12-06-2016 Through 16-06-2016",

}

TY - JOUR

T1 - Charge carrier diffusion length determination in 4H-SiC schottky alpha detectors

AU - Jarrell, Joshua

AU - Reinke, Benjamin

AU - Chaiken, Max

AU - Wilson, Brandon

AU - Windl, Wolfgang

AU - Esser, Bryan

AU - Cao, Lei

AU - Blue, Thomas

PY - 2016

Y1 - 2016

UR - https://www.scopus.com/pages/publications/85117968155

M3 - Conference article

AN - SCOPUS:85117968155

SN - 0003-018X

VL - 114

SP - 175

EP - 177

JO - Transactions of the American Nuclear Society

JF - Transactions of the American Nuclear Society

IS - 1

T2 - 2016 Transactions of the American Nuclear Society Annual Meeting, ANS 2016

Y2 - 12 June 2016 through 16 June 2016

ER -