Characterizing the I/O behavior of scientific applications on the cray XT

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

27 Scopus citations

Abstract

Scientific applications use input/output (I/O) for obtaining initial conditions and execution parameters, as a persistent way of saving program output, and for safeguarding against system unreliability. Although system sizes are expected to continue increasing, I/O performance is not expected to keep pace with system computation and communication performance. Understanding application I/O demands and system I/O capabilities is the first step toward bridging this gap between them. In this paper, we present our approach for characterizing the I/O demands of applications on the Cray XT. We also present preliminary case studies showing the use of our I/O characterization infrastructure with climate studies and combustion simulation programs.

Original languageEnglish
Title of host publicationProceedings of the 2nd International Petascale Data Storage Workshop, PDSW '07, held in Conjunction with Supercomputing '07
Pages50-55
Number of pages6
DOIs
StatePublished - 2008
Event2nd International Petascale Data Storage Workshop, PDSW '07, held in Conjunction with Supercomputing '07 -
Duration: Nov 11 2007Nov 11 2007

Publication series

NameProceedings of the 2nd International Petascale Data Storage Workshop, PDSW '07, held in Conjunction with Supercomputing '07

Conference

Conference2nd International Petascale Data Storage Workshop, PDSW '07, held in Conjunction with Supercomputing '07
Period11/11/0711/11/07

Keywords

  • Cray XT
  • Instrumentation
  • Performance data collection

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