Characterizing Current Conduction in Coated Conductors Using Transport and Contact-Free Magnetic Methods

Özgür Polat, James R. Thompson, David K. Christen, Dhananjay Kumar, Patrick M. Martin, Sylvester W. Cook, Frederick A. List, John W. Sinclair, Venkat Selvamanickam, Yimin M. Chen

Research output: Chapter in Book/Report/Conference proceedingChapterpeer-review

1 Scopus citations
Original languageEnglish
Title of host publicationHigh Temperature Superconductors
PublisherWiley-VCH
Pages49-65
Number of pages17
ISBN (Print)9783527408276
DOIs
StatePublished - Oct 13 2010

Keywords

  • Critical current density versus magnetic field
  • Cuprates
  • Irreversible magnetization
  • Magnetic relaxation (flux creep)
  • Nanoscale imperfections and pinning
  • Swept magnetic field
  • Transport critical current density
  • Vortex dynamics

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