Characterization on photoelectric property of TiN/Si heterojunction

Jie Xing, Huiying Hao, Zhiyuan Zheng

Research output: Contribution to journalArticlepeer-review

1 Scopus citations

Abstract

Highly-sensitive photovoltaic effect of TiN/Si heterojunction has been reported. The junction exhibited a high photovoltaic sensitivity (PVS) of 57 mV/mW to He-Ne laser illumination when the laser spot was incident onto the Si substrate. The change of Schottky barrier height due to illumination has been discussed. However, when the laser spot was incident on the TiN film surface, the PVS was only 0.71 mV/mW, which was mainly attributed to the low transmittance of TiN film to He-Ne photons. And further, when a UV Hg lamp irradiated the TiN film, the PVS was enhanced much and increased up to 421 mV/mW.

Original languageEnglish
Pages (from-to)1174-1177
Number of pages4
JournalOptoelectronics and Advanced Materials, Rapid Communications
Volume5
Issue number11
StatePublished - 2011
Externally publishedYes

Keywords

  • Heterojunction
  • Photoelectric
  • Schottky barrier

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