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Characterization of thin-film amorphous semiconductors using spectroscopic ellipsometry
G. E. Jellison, V. I. Merkulov, A. A. Puretzky, D. B. Geohegan, G. Eres, D. H. Lowndes, J. B. Caughman
Research output: Contribution to journal › Article › peer-review
155
Scopus
citations