Abstract
Cross-sectional transmission electron microscopy was used to characterize the alumina scales formed on several Ni-base alumina-formers. The alumina scale microstructure of Ni-20at%Cr-19Al-0.05Y after 100, l h cycles at 1,100°C was compared to an isothermally-grown scale. Despite being near the onset of mass loss in cyclic testing, very few defects were noted in either scale microstructure. The more adherent scales that form on Hf-doped NiAl and Ni-49at%Al-2Cr were also characterized. With the addition of Cr, the formation of a-Cr precipitates at the metal-oxide interface coincided with increased long-term scale spallation. No similar precipitation mechanism was observed to be associated with scale spallation on NiCrAlY.
Original language | English |
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Pages (from-to) | 165-171 |
Number of pages | 7 |
Journal | Materials at High Temperatures |
Volume | 17 |
Issue number | 1 |
DOIs | |
State | Published - 2000 |
Event | 4th International Conference on the Microscopy of Oxidation - Cambridge, United Kingdom Duration: Sep 20 1999 → Sep 22 1999 |
Keywords
- Alumina scales
- Chromium
- Nickel