Characterization of phase evolution in YBCO coated conductors produced by the ex situ BaF2 process

R. Feenstra; F. A. List; Y. Zhang; D. K. Christen; V. A. Maroni; D. J. Miller; D. M. Feldmann

doi:10.1109/TASC.2007.899994

Characterization of phase evolution in YBCO coated conductors produced by the ex situ BaF₂ process

R. Feenstra, F. A. List, Y. Zhang, D. K. Christen, V. A. Maroni, D. J. Miller, D. M. Feldmann

Deposition Science and Technology

Research output: Contribution to journal › Article › peer-review

10 Scopus citations

Abstract

Raman microprobe spectroscopy and scanning electron microscopy were used to study the initial nucleation and growth of YBCO in thick precursors by the BaFa ex situ process. For quenched films of 2 μm thickness, the data indicate a low density of c-axis nuclei near the substrate, apparently due to a reduced oxygen concentration deep inside the precursor layer. Significant non c-axis growth was also observed; the majority of this material nucleates away from the substrate. Measurement of the conversion rate by in situ XRD for films in the range 0.2-2 μm suggest a weak thickness dependence.

Original language	English
Pages (from-to)	3254-3258
Number of pages	5
Journal	IEEE Transactions on Applied Superconductivity
Volume	17
Issue number	2
DOIs	https://doi.org/10.1109/TASC.2007.899994
State	Published - Jun 2007

Funding

Manuscript received August 29, 2006. This work was supported by the U.S. Department of Energy, Office of Electricity Delivery and Energy Reliability and Basic Energy Sciences as part of a DOE program to develop electric power technology. The work at Oak Ridge was supported by Contract DE-AC05-00OR22725 with UT-Batelle, LLC. The work at Argonne was supported by Contract W-31-109–ENG-38.

Funders	Funder number
U.S. Department of Energy	DE-AC05-00OR22725, W-31-109–ENG-38

Keywords

Raman spectroscopy
Superconducting epitaxial layers
Temperature superconductors
Thick films

Access to Document

10.1109/TASC.2007.899994

Cite this

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abstract = "Raman microprobe spectroscopy and scanning electron microscopy were used to study the initial nucleation and growth of YBCO in thick precursors by the BaFa ex situ process. For quenched films of 2 μm thickness, the data indicate a low density of c-axis nuclei near the substrate, apparently due to a reduced oxygen concentration deep inside the precursor layer. Significant non c-axis growth was also observed; the majority of this material nucleates away from the substrate. Measurement of the conversion rate by in situ XRD for films in the range 0.2-2 μm suggest a weak thickness dependence.",

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AU - Christen, D. K.

AU - Maroni, V. A.

AU - Miller, D. J.

AU - Feldmann, D. M.

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