Characterization of multi-element CZT arrays

L. Cirignano; K. S. Shah; P. Bennett; L. Li; F. Lu; J. Buturlia; W. Yao; G. Wright; R. B. James

doi:10.1117/12.407600

Characterization of multi-element CZT arrays

L. Cirignano, K. S. Shah, P. Bennett, L. Li, F. Lu, J. Buturlia, W. Yao, G. Wright, R. B. James

Advanced Radiation Detection, Imaging, D

Research output: Contribution to journal › Article › peer-review

1 Scopus citations

Abstract

We report on device fabrication and testing of CZT grown by the Modified Vertical Bridgman (MVB) method. Several samples of single-crystal MVB grown CZT were obtained from Yinnel Tech. Both single element devices and 2-dimensional arrays were fabricated. Resistivity and electron mobility-lifetime product were measured, and pulse height spectra were recorded for various isotopic sources. Arrays 5 mm thick and an array 1.13-cm thick were evaluated.

Original language	English
Pages (from-to)	23-28
Number of pages	6
Journal	Proceedings of SPIE - The International Society for Optical Engineering
Volume	4141
Issue number	1
DOIs	https://doi.org/10.1117/12.407600
State	Published - Nov 21 2000

Keywords

CZT arrays
Gamma-ray detectors
Modified Vertical Bridgman CZT

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AU - Cirignano, L.

AU - Shah, K. S.

AU - Bennett, P.

AU - Li, L.

AU - Lu, F.

AU - Buturlia, J.

AU - Yao, W.

AU - Wright, G.

AU - James, R. B.

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AB - We report on device fabrication and testing of CZT grown by the Modified Vertical Bridgman (MVB) method. Several samples of single-crystal MVB grown CZT were obtained from Yinnel Tech. Both single element devices and 2-dimensional arrays were fabricated. Resistivity and electron mobility-lifetime product were measured, and pulse height spectra were recorded for various isotopic sources. Arrays 5 mm thick and an array 1.13-cm thick were evaluated.

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KW - Gamma-ray detectors

KW - Modified Vertical Bridgman CZT

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JF - Proceedings of SPIE - The International Society for Optical Engineering

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Characterization of multi-element CZT arrays

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Keywords

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