Characterization of durable nanostructured thin film catalysts tested under transient conditions using analytical aberration-corrected electron microscopy

D. A. Cullen, K. L. More, K. S. Reeves, G. D. Vernstrom, L. L. Atanasoska, G. M. Haugen, R. T. Atanasoski

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

8 Scopus citations

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