Characterization of AlAs/GaAs superlattice barriers using electrical barrier height analysis

M. J. Paulus, C. I. Huang, C. A. Bozada, M. E. Cheney, S. C. Dudley, C. E. Stutz, K. R. Evans, R. L. Jones

Research output: Contribution to journalArticlepeer-review

Fingerprint

Dive into the research topics of 'Characterization of AlAs/GaAs superlattice barriers using electrical barrier height analysis'. Together they form a unique fingerprint.

Engineering

Material Science