Characterization and properties of the AlPdMn 5 surface

G. Cappello, A. Dechelette, F. Schmithusen, J. Chevrier, F. Comin, A. Stierle, V. Formoso, M. De Boissieu, T. Lograsso, C. Jenks, D. Delaney

Research output: Contribution to journalConference articlepeer-review

9 Scopus citations

Abstract

Experiments based on Low Energy Electron Diffraction (LEED), Scanning Tunneling Microscopy (STM), X ray Photodiffraction (XPD), X Ray Photoemission Spectroscopy (XPS) and Auger spectroscopy were carried out to probe the surface of the AlPdMn quasicrystals perpendicular to a fivefold axis. Quasicrystal evaporation was directly characterized at high temperature. The results contribute to establish the reliability and the reproducibility of key features observed at the quasicrystal in the case of sputtered and annealed surfaces.

Original languageEnglish
Pages (from-to)243-249
Number of pages7
JournalMaterials Research Society Symposium - Proceedings
Volume553
StatePublished - 1999
Externally publishedYes
EventProceedings of the 1998 MRS Fall Meeting - The Symposium 'Advanced Catalytic Materials-1998' - Boston, MA, USA
Duration: Nov 30 1998Dec 3 1998

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