Abstract
Experiments based on Low Energy Electron Diffraction (LEED), Scanning Tunneling Microscopy (STM), X ray Photodiffraction (XPD), X Ray Photoemission Spectroscopy (XPS) and Auger spectroscopy were carried out to probe the surface of the AlPdMn quasicrystals perpendicular to a fivefold axis. Quasicrystal evaporation was directly characterized at high temperature. The results contribute to establish the reliability and the reproducibility of key features observed at the quasicrystal in the case of sputtered and annealed surfaces.
Original language | English |
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Pages (from-to) | 243-249 |
Number of pages | 7 |
Journal | Materials Research Society Symposium - Proceedings |
Volume | 553 |
State | Published - 1999 |
Externally published | Yes |
Event | Proceedings of the 1998 MRS Fall Meeting - The Symposium 'Advanced Catalytic Materials-1998' - Boston, MA, USA Duration: Nov 30 1998 → Dec 3 1998 |