@inbook{fe66a8f5da9c44fc9222d0d559cb2cd6,
title = "CHAPTER 2: Scanning transmission electron microscopyy",
abstract = "The scanning transmission electron microscope (STEM) is one of the most useful tools in many areas of atomic-scale materials science and nanocharacterization. A STEM has the ability to generate local maps of the chemical composition and electronic structure at atomic resolution, even in complex or unknown samples. Here we describe the important components of a state-of-the-art aberration-corrected STEM and review the application of STEM imaging to a variety of published nanocharacterisation examples in catalysis and solid state materials problems.",
author = "Lupini, {A. R.} and Rashkeev, {S. N.} and M. Varela and Borisevich, {A. Y.} and Oxley, {M. P.} and {Van Benthem}, K. and Y. Peng and {De Jonge}, N. and Veith, {G. M.} and Pennycook, {T. J.} and W. Zhou and R. Ishikawa and Chisholm, {M. F.} and Pantelides, {S. T.} and Pennycook, {S. J.}",
note = "Publisher Copyright: {\textcopyright} The Royal Society of Chemistry 2015.",
year = "2015",
doi = "10.1039/9781782621867-00030",
language = "English",
series = "RSC Nanoscience and Nanotechnology",
publisher = "Royal Society of Chemistry",
number = "37",
pages = "30--79",
editor = "Kirkland, {Angus I.} and Haigh, {Sarah J.}",
booktitle = "Hierarchical Nanostructures for Energy Devices",
edition = "37",
}