CdTe and Cd 0.9Zn 0.1Te crystal growth and characterization for nuclear spectrometers

Krishna C. Mandal; Sung Hoon Kang; Michael Choi; Gomez Wright; Gerald E. Jellison

doi:10.1117/12.683802

CdTe and Cd _0.9Zn _0.1Te crystal growth and characterization for nuclear spectrometers

Krishna C. Mandal, Sung Hoon Kang, Michael Choi, Gomez Wright, Gerald E. Jellison

Advanced Radiation Detection, Imaging, D

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

2 Scopus citations

Abstract

Large volume single crystals of CdTe and Cd _0.9Zn _0.1Te (CZT) have been grown by a controlled vertical Bridgman technique using in-house zone refined precursors and characterized through structural, electrical, optical, and spectroscopic methods. The grown crystals (diameter ≥2.5 cm and length >10 cm) have shown promising characteristics for high-resolution room temperature solid-state radiation detectors due to their high resistivity (∼10 ¹⁰ Ω·cm for CdTe, and >10 ¹¹ Ω·cm for CZT) and good charge transport properties [μτ _e - (2-5)×10 ^-3 cm ²/V]. The fabricated detectors in planar single element and Frisch collar configurations have shown very low leakage currents and high count rates for various sources, including Am-241, and Cs-137. The grown crystals have been further characterized by X-ray diffraction (XRD), infrared spectroscopy (IR), and transmission two-modulator generalized ellipsometry (2-MGE). Details of the CdTe and CZT characterization results, detector fabrication steps, and testing with radiation sources are presented. The CdTe and CZT crystals have shown high prospects for low power rating solid-state nuclear spectrometers and medical imaging devices.

Original language	English
Title of host publication	Hard X-Ray and Gamma-Ray Detector Physics and Penetrating Radiation Systems VIII
DOIs	https://doi.org/10.1117/12.683802
State	Published - 2006
Event	Hard X-Ray and Gamma-Ray Detector Physics and Penetrating Radiation Systems VIII - San Diego, CA, United States Duration: Aug 14 2006 → Aug 17 2006

Publication series

Name	Proceedings of SPIE - The International Society for Optical Engineering
Volume	6319
ISSN (Print)	0277-786X

Conference

Conference	Hard X-Ray and Gamma-Ray Detector Physics and Penetrating Radiation Systems VIII
Country/Territory	United States
City	San Diego, CA
Period	08/14/06 → 08/17/06

Keywords

Cd Zn Te
CdTe
Crystal growth
Nuclear spectrometer
Transmission two-modulator generalized ellipsometry (2-MGE)
Vertical Bridgman
Zone refining

Access to Document

10.1117/12.683802

Cite this

Mandal, K. C., Kang, S. H., Choi, M., Wright, G., & Jellison, G. E. (2006). CdTe and Cd _0.9Zn _0.1Te crystal growth and characterization for nuclear spectrometers. In Hard X-Ray and Gamma-Ray Detector Physics and Penetrating Radiation Systems VIII Article 63190X (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 6319). https://doi.org/10.1117/12.683802

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title = "CdTe and Cd 0.9Zn 0.1Te crystal growth and characterization for nuclear spectrometers",

abstract = "Large volume single crystals of CdTe and Cd 0.9Zn 0.1Te (CZT) have been grown by a controlled vertical Bridgman technique using in-house zone refined precursors and characterized through structural, electrical, optical, and spectroscopic methods. The grown crystals (diameter ≥2.5 cm and length >10 cm) have shown promising characteristics for high-resolution room temperature solid-state radiation detectors due to their high resistivity (∼10 10 Ω·cm for CdTe, and >10 11 Ω·cm for CZT) and good charge transport properties [μτ e - (2-5)×10 -3 cm 2/V]. The fabricated detectors in planar single element and Frisch collar configurations have shown very low leakage currents and high count rates for various sources, including Am-241, and Cs-137. The grown crystals have been further characterized by X-ray diffraction (XRD), infrared spectroscopy (IR), and transmission two-modulator generalized ellipsometry (2-MGE). Details of the CdTe and CZT characterization results, detector fabrication steps, and testing with radiation sources are presented. The CdTe and CZT crystals have shown high prospects for low power rating solid-state nuclear spectrometers and medical imaging devices.",

keywords = "Cd Zn Te, CdTe, Crystal growth, Nuclear spectrometer, Transmission two-modulator generalized ellipsometry (2-MGE), Vertical Bridgman, Zone refining",

author = "Mandal, {Krishna C.} and Kang, {Sung Hoon} and Michael Choi and Gomez Wright and Jellison, {Gerald E.}",

year = "2006",

doi = "10.1117/12.683802",

language = "English",

isbn = "0819463981",

series = "Proceedings of SPIE - The International Society for Optical Engineering",

booktitle = "Hard X-Ray and Gamma-Ray Detector Physics and Penetrating Radiation Systems VIII",

note = "Hard X-Ray and Gamma-Ray Detector Physics and Penetrating Radiation Systems VIII ; Conference date: 14-08-2006 Through 17-08-2006",

}

Mandal, KC, Kang, SH, Choi, M, Wright, G & Jellison, GE 2006, CdTe and Cd _0.9Zn _0.1Te crystal growth and characterization for nuclear spectrometers. in Hard X-Ray and Gamma-Ray Detector Physics and Penetrating Radiation Systems VIII., 63190X, Proceedings of SPIE - The International Society for Optical Engineering, vol. 6319, Hard X-Ray and Gamma-Ray Detector Physics and Penetrating Radiation Systems VIII, San Diego, CA, United States, 08/14/06. https://doi.org/10.1117/12.683802

CdTe and Cd _0.9Zn _0.1Te crystal growth and characterization for nuclear spectrometers. / Mandal, Krishna C.; Kang, Sung Hoon; Choi, Michael et al.
Hard X-Ray and Gamma-Ray Detector Physics and Penetrating Radiation Systems VIII. 2006. 63190X (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 6319).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - CdTe and Cd 0.9Zn 0.1Te crystal growth and characterization for nuclear spectrometers

AU - Mandal, Krishna C.

AU - Kang, Sung Hoon

AU - Choi, Michael

AU - Wright, Gomez

AU - Jellison, Gerald E.

PY - 2006

Y1 - 2006

N2 - Large volume single crystals of CdTe and Cd 0.9Zn 0.1Te (CZT) have been grown by a controlled vertical Bridgman technique using in-house zone refined precursors and characterized through structural, electrical, optical, and spectroscopic methods. The grown crystals (diameter ≥2.5 cm and length >10 cm) have shown promising characteristics for high-resolution room temperature solid-state radiation detectors due to their high resistivity (∼10 10 Ω·cm for CdTe, and >10 11 Ω·cm for CZT) and good charge transport properties [μτ e - (2-5)×10 -3 cm 2/V]. The fabricated detectors in planar single element and Frisch collar configurations have shown very low leakage currents and high count rates for various sources, including Am-241, and Cs-137. The grown crystals have been further characterized by X-ray diffraction (XRD), infrared spectroscopy (IR), and transmission two-modulator generalized ellipsometry (2-MGE). Details of the CdTe and CZT characterization results, detector fabrication steps, and testing with radiation sources are presented. The CdTe and CZT crystals have shown high prospects for low power rating solid-state nuclear spectrometers and medical imaging devices.

AB - Large volume single crystals of CdTe and Cd 0.9Zn 0.1Te (CZT) have been grown by a controlled vertical Bridgman technique using in-house zone refined precursors and characterized through structural, electrical, optical, and spectroscopic methods. The grown crystals (diameter ≥2.5 cm and length >10 cm) have shown promising characteristics for high-resolution room temperature solid-state radiation detectors due to their high resistivity (∼10 10 Ω·cm for CdTe, and >10 11 Ω·cm for CZT) and good charge transport properties [μτ e - (2-5)×10 -3 cm 2/V]. The fabricated detectors in planar single element and Frisch collar configurations have shown very low leakage currents and high count rates for various sources, including Am-241, and Cs-137. The grown crystals have been further characterized by X-ray diffraction (XRD), infrared spectroscopy (IR), and transmission two-modulator generalized ellipsometry (2-MGE). Details of the CdTe and CZT characterization results, detector fabrication steps, and testing with radiation sources are presented. The CdTe and CZT crystals have shown high prospects for low power rating solid-state nuclear spectrometers and medical imaging devices.

KW - Cd Zn Te

KW - CdTe

KW - Crystal growth

KW - Nuclear spectrometer

KW - Transmission two-modulator generalized ellipsometry (2-MGE)

KW - Vertical Bridgman

KW - Zone refining

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U2 - 10.1117/12.683802

DO - 10.1117/12.683802

M3 - Conference contribution

AN - SCOPUS:33750707572

SN - 0819463981

SN - 9780819463982

T3 - Proceedings of SPIE - The International Society for Optical Engineering

BT - Hard X-Ray and Gamma-Ray Detector Physics and Penetrating Radiation Systems VIII

T2 - Hard X-Ray and Gamma-Ray Detector Physics and Penetrating Radiation Systems VIII

Y2 - 14 August 2006 through 17 August 2006

ER -