Carbon film in RF surface plasma source with cesiation

Vadim Dudnikov, B. Han, S. Murray, T. Pennisi, C. Stinson, M. Stockli, R. Welton, A. Dudnikov

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Scopus citations

Abstract

Deposition of carbon film in RF SPS is observed. It is assumed that persistent cesiation without continuous cesium injection in the Spallation Neutron Source RF Surface Plasma Source (SPS) is related to deposition of carbon film on the collar converter. The work function dependence for graphite with alkali deposition has no minimum typical for metals and semiconductors and the final work function is higher. For this reason, the probability of H- secondary emission from cesiated metal and semiconductors can be higher than from cesiated carbon films but the carbon film maintains cesiation longer and can operate with low cesium consumption.

Original languageEnglish
Title of host publicationProceedings of the 17th International Conference on Ion Sources
EditorsEdgar Mahner, Richard Scrivens, Richard Pardo, Jacques Lettry, Bruce Marsh
PublisherAmerican Institute of Physics Inc.
ISBN (Print)9780735417274
DOIs
StatePublished - Sep 21 2018
Event17th International Conference on Ion Sources 2018 - Geneva, Switzerland
Duration: Sep 15 2017Sep 20 2017

Publication series

NameAIP Conference Proceedings
Volume2011
ISSN (Print)0094-243X
ISSN (Electronic)1551-7616

Conference

Conference17th International Conference on Ion Sources 2018
Country/TerritorySwitzerland
CityGeneva
Period09/15/1709/20/17

Funding

The work was supported in part by US DOE Contract DE-AC05-00OR22725 and by STTR grant, DE-SC0011323.

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