Carbon concentration measurements by atom probe tomography in the ferritic phase of high-silicon steels

Rosalia Rementeria, Jonathan D. Poplawsky, Maria M. Aranda, Wei Guo, Jose A. Jimenez, Carlos Garcia-Mateo, Francisca G. Caballero

Research output: Contribution to journalArticlepeer-review

41 Scopus citations

Abstract

Recent studies using atom probe tomography (APT) show that bainitic ferrite formed at low temperature contains more carbon than what is consistent with the paraequilibrium phase diagram. However, nanocrystalline bainitic ferrite exhibits a non-homogeneous distribution of carbon atoms in arrangements with specific compositions, i.e. Cottrell atmospheres, carbon clusters, and carbides, in most cases with a size of a few nanometers. The ferrite volume within a single platelet that is free of these carbon-enriched regions is extremely small. Proximity histograms can be compromised on the ferrite side, and a great deal of care should be taken to estimate the carbon content in regions of bainitic ferrite free from carbon agglomeration. For this purpose, APT measurements were first validated for the ferritic phase in a pearlitic sample and further performed for the bainitic ferrite matrix in high-silicon steels isothermally transformed between 200 °C and 350 °C. Additionally, results were compared with the carbon concentration values derived from X-ray diffraction (XRD) analyses considering a tetragonal lattice and previous APT studies. The present results reveal a strong disagreement between the carbon content values in the bainitic ferrite matrix as obtained by APT and those derived from XRD measurements. Those differences have been attributed to the development of carbon-clustered regions with an increased tetragonality in a carbon-depleted matrix.

Original languageEnglish
Pages (from-to)359-368
Number of pages10
JournalActa Materialia
Volume125
DOIs
StatePublished - Feb 15 2017

Keywords

  • Atom probe tomography (APT)
  • Bainitic steel
  • Nanostructure
  • Tetragonal distortion
  • X-ray diffraction (XRD)

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