Capping-induced suppression of annealing effects on Ga1-xMnxAs epilayers

  • M. B. Stone
  • , K. C. Ku
  • , S. J. Potashnik
  • , B. L. Sheu
  • , N. Samarth
  • , P. Schiffer

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Abstract

The effects of annealing on Ga1-xMnxAs epilayers that are capped by a thin layer of GaAs were studied. It was found that the presence of the capping layer significantly suppresses TC in the as-grown samples and also reduces the physical changes induced by annealing. The effect on annealing increased with the capping layer thickness, and a 10 monolayer (ML) cap almost completely eliminated the effects of annealing.

Original languageEnglish
Pages (from-to)4568-4570
Number of pages3
JournalApplied Physics Letters
Volume83
Issue number22
DOIs
StatePublished - Dec 1 2003
Externally publishedYes

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