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Calibrating cryogenic temperature of TEM specimens using EELS
Abinash Kumar
,
Elizaveta Tiukalova
, Kartik Venkatraman
,
Andrew Lupini
,
Jordan A. Hachtel
,
Miaofang Chi
electron Microscopy and Microanalysis
Research output
:
Contribution to journal
›
Article
›
peer-review
6
Scopus citations
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Engineering
Carrier Concentration
50%
Cryogenic Temperature
100%
Electron Energy
100%
Energy Dissipation
100%
Intermediate Temperature
50%
Low-Temperature
100%
Material Behavior
50%
Powerful Tool
50%
Room Temperature
50%
Setpoints
50%
Specimen Temperature
50%
Temperature Calibration
100%
Physics
Cryogenic Temperature
100%
Electron Beam
50%
Electron Density
50%
Electron Energy
100%
Electron Microscope
50%
Liquid Nitrogen
50%
Plasmon
50%
Room Temperature
50%
Thermal Expansion
50%
Transmission Electron Microscopy
50%
Chemistry
Aluminum
50%
Ambient Reaction Temperature
50%
Electron Beam
50%
Electron Density
50%
Electron Energy Loss Spectroscopy
100%
Plasmon
50%
Scanning Transmission Electron Microscopy
50%
Thermal Expansion
50%