Buffer-layer-controlled nickeline vs zinc-blende/wurtzite-type MnTe growths on c -plane Al2 O3 substrates

Deepti Jain, Hee Taek Yi, Alessandro R. Mazza, Kim Kisslinger, Myung Geun Han, Matthew Brahlek, Seongshik Oh

Research output: Contribution to journalArticlepeer-review

2 Scopus citations

Abstract

In the recent past, MnTe has proven to be a crucial component of the intrinsic magnetic topological insulator (IMTI) family [MnTe]m[Bi2Te3]n, which hosts a wide range of magnetotopological properties depending on the choice of m and n. However, bulk crystal growth allows only a few combinations of m and n for these IMTIs due to the strict limitations of the thermodynamic growth conditions. One way to overcome this challenge is to utilize the atomic layer-by-layer molecular beam epitaxy (MBE) technique, which allows arbitrary sequences of [MnTe]m and [Bi2Te3]n to be formed beyond the thermodynamic limit. For such MBE growth, finding optimal growth templates and conditions for the parent building block, MnTe, is a key requirement. Here, we report that two different hexagonal phases of MnTe-nickeline (NC) and zinc-blende/wurtzite (ZB-WZ) structures, with distinct in-plane lattice constants of 4.20±0.04 and 4.39±0.04Å, respectively-can be selectively grown on c-plane Al2O3 substrates using different buffer layers and growth temperatures. Moreover, we provide comparative studies of different MnTe phases using atomic-resolution scanning transmission electron microscopy, and we show that ZB- and WZ-like stacking sequences can easily alternate between the two. Surprisingly, In2Se3 buffer layer, despite its lattice constant (4.02Å) being closer to that of the NC phase, fosters the ZB-WZ instead, whereas Bi2Te3, sharing the same lattice constant (4.39Å) with the ZB-WZ phase, fosters the NC phase. These discoveries suggest that lattice matching is not always the most critical factor determining the preferred phase during epitaxial growth. Overall, this will deepen our understanding of epitaxial growth modes for chalcogenide materials and accelerate progress toward new IMTI phases as well as other magnetotopological applications.

Original languageEnglish
Article number014203
JournalPhysical Review Materials
Volume8
Issue number1
DOIs
StatePublished - Jan 2024

Funding

This work is supported by National Science Foundation's DMR2004125, Army Research Office's W911NF2010108, and MURI W911NF2020166. The x-ray diffraction work at Oak Ridge National Laboratory is supported by the U.S. Department of Energy (DOE), Office of Science, Basic Energy Sciences (BES), Materials Sciences and Engineering Division. The scanning transmission electron microscopy work performed at Brookhaven National Laboratory is sponsored by the U.S. Department of Energy, Basic Energy Sciences, Materials Sciences and Engineering Division, under Contract No. DESC0012704. This research used the Electron Microscopy resources (the Helios G5 FIB) of the Center for Functional Nanomaterials (CFN), which is a U.S. Department of Energy Office of Science User Facility, at Brookhaven National Laboratory under Contract No. DESC0012704. We acknowledge Hussein Hijazi for RBS measurements.

FundersFunder number
Center for Functional Nanomaterials
National Science FoundationDMR2004125
U.S. Department of Energy
Army Research OfficeW911NF2010108
Office of Science
Basic Energy Sciences
Brookhaven National Laboratory
Division of Materials Sciences and EngineeringDESC0012704
Multidisciplinary University Research InitiativeW911NF2020166

    Fingerprint

    Dive into the research topics of 'Buffer-layer-controlled nickeline vs zinc-blende/wurtzite-type MnTe growths on c -plane Al2 O3 substrates'. Together they form a unique fingerprint.

    Cite this