Bragg-diffraction-type acousto-optic device using Pb(ZrTi)O3 film

Changno Lee; Sangho Kim; Kwangsoo No

doi:10.1063/1.1571664

Bragg-diffraction-type acousto-optic device using Pb(ZrTi)O₃ film

Changno Lee, Sangho Kim, Kwangsoo No

Research output: Contribution to journal › Article › peer-review

4 Scopus citations

Abstract

The Bragg-diffraction-type acousto-optic (AO) device using Pb(ZrTi)O₃ film was discussed. In the fabrication of a Bragg diffraction type AO device, it was important to select an optimum piezoeletric material and an optical waveguide with large piezoelectric constant AO figure of merit (M₂). Analysis of ζ with varied film thickness allowed to obtain the total propagation ratio of acoustic power from the PZT to SiN_x film and M_{2, SiNx} (0.75 ×10^-18 s³/g).

Original language	English
Pages (from-to)	3153-3155
Number of pages	3
Journal	Applied Physics Letters
Volume	82
Issue number	19
DOIs	https://doi.org/10.1063/1.1571664
State	Published - May 12 2003
Externally published	Yes

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abstract = "The Bragg-diffraction-type acousto-optic (AO) device using Pb(ZrTi)O3 film was discussed. In the fabrication of a Bragg diffraction type AO device, it was important to select an optimum piezoeletric material and an optical waveguide with large piezoelectric constant AO figure of merit (M2). Analysis of ζ with varied film thickness allowed to obtain the total propagation ratio of acoustic power from the PZT to SiNx film and M2, SiNx (0.75 ×10-18 s3/g).",

author = "Changno Lee and Sangho Kim and Kwangsoo No",

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AU - Kim, Sangho

AU - No, Kwangsoo

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N2 - The Bragg-diffraction-type acousto-optic (AO) device using Pb(ZrTi)O3 film was discussed. In the fabrication of a Bragg diffraction type AO device, it was important to select an optimum piezoeletric material and an optical waveguide with large piezoelectric constant AO figure of merit (M2). Analysis of ζ with varied film thickness allowed to obtain the total propagation ratio of acoustic power from the PZT to SiNx film and M2, SiNx (0.75 ×10-18 s3/g).

AB - The Bragg-diffraction-type acousto-optic (AO) device using Pb(ZrTi)O3 film was discussed. In the fabrication of a Bragg diffraction type AO device, it was important to select an optimum piezoeletric material and an optical waveguide with large piezoelectric constant AO figure of merit (M2). Analysis of ζ with varied film thickness allowed to obtain the total propagation ratio of acoustic power from the PZT to SiNx film and M2, SiNx (0.75 ×10-18 s3/g).

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Bragg-diffraction-type acousto-optic device using Pb(ZrTi)O₃ film

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