Bias dependent two-channel conduction in InAlN/AlN/GaN structures

J. H. Leach, X. Ni, X. Li, M. Wu, U. Özgür, H. Morko̧, L. Zhou, D. A. Cullen, D. J. Smith, H. Cheng, Ç Kurdak, J. R. Meyer, I. Vurgaftman

Research output: Contribution to journal › Article › peer-review

14 Scopus citations

Fingerprint

Dive into the research topics of 'Bias dependent two-channel conduction in InAlN/AlN/GaN structures'. Together they form a unique fingerprint.

Engineering

Material Science