Abstract
Here we report the bias-evolution of the electrical double layer structure of an ionic liquid on highly ordered pyrolytic graphite measured by atomic force microscopy. We observe reconfiguration under applied bias and the orientational transitions in the Stern layer. The synergy between molecular dynamics simulation and experiment provides a comprehensive picture of structural phenomena and long and short-range interactions, which improves our understanding of the mechanism of charge storage on a molecular level.
Original language | English |
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Pages (from-to) | 5954-5960 |
Number of pages | 7 |
Journal | Nano Letters |
Volume | 13 |
Issue number | 12 |
DOIs | |
State | Published - Dec 11 2013 |
Keywords
- Ionic liquid
- atomic force microscopy
- electrochemical double layer
- force-distance curve
- highly ordered pyrolytic graphite