Bias between ENDF/B-VIII.0 and ENDF/B-VII.1 for LEU pin array systems

Research output: Contribution to journalConference articlepeer-review

1 Scopus citations
Original languageEnglish
Pages (from-to)952-955
Number of pages4
JournalTransactions of the American Nuclear Society
Volume121
DOIs
StatePublished - 2019
Event2019 Transactions of the American Nuclear Society, ANS 2019 - Washington, United States
Duration: Nov 17 2019Nov 21 2019

Funding

_____________________________ * Notice: This manuscript has been authored by UT-Battelle, LLC, under contract DE-AC05-00OR22725 with the US Department of Energy (DOE). The US government retains and the publisher, by accepting the article for publication, acknowledges that the US government retains a nonexclusive, paid-up, irrevocable, worldwide license to publish or reproduce the published form of this manuscript, or allow others to do so, for US government purposes. DOE will provide public access to these results of federally sponsored research in accordance with the DOE Public Access Plan (http://energy.gov/downloads/ doe-public-access-plan).

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