Bias assessment of 233U systems using SCALE TSURFER

Bias assessment of ²³³U systems using SCALE TSURFER

Research output: Contribution to journal › Conference article › peer-review

Original language	English
Pages (from-to)	307-311
Number of pages	5
Journal	Transactions of the American Nuclear Society
Volume	102
State	Published - 2010
Event	2010 ANS Annual Meeting and Embedded Topical Meetings - San Diego, CA, United States Duration: Jun 13 2010 → Jun 17 2010

@article{63da2f6f2b2e4061839805908b5c3b31,

title = "Bias assessment of 233U systems using SCALE TSURFER",

author = "Rearden, \{Bradley T.\} and Don Mueller",

year = "2010",

language = "English",

volume = "102",

pages = "307--311",

journal = "Transactions of the American Nuclear Society",

issn = "0003-018X",

note = "2010 ANS Annual Meeting and Embedded Topical Meetings ; Conference date: 13-06-2010 Through 17-06-2010",

}

TY - JOUR

T1 - Bias assessment of 233U systems using SCALE TSURFER

AU - Rearden, Bradley T.

AU - Mueller, Don

PY - 2010

Y1 - 2010

UR - https://www.scopus.com/pages/publications/79551679786

M3 - Conference article

AN - SCOPUS:79551679786

SN - 0003-018X

VL - 102

SP - 307

EP - 311

JO - Transactions of the American Nuclear Society

JF - Transactions of the American Nuclear Society

T2 - 2010 ANS Annual Meeting and Embedded Topical Meetings

Y2 - 13 June 2010 through 17 June 2010

ER -