Bent silicon crystal in the Laue geometry to resolve x-ray fluorescence for x-ray absorption spectroscopy

The use of a bent Laue analyzer (BLA) to resolve the L fluorescence x rays of neighboring actinide elements was demonstrated. The adnavtages of a highly bent silicon x-ray analyzer in the Laue geometry were discussed. For small quantities of Np in the presence of U, a large gain in the signal to background ratio was shown. The results show that a bent Laue analyzer with a peak-to-valley ratio of more than 1000:1 extends the useful spectroscopy limits by as much as factor of 100 times.