Bent silicon crystal in the Laue geometry to resolve x-ray fluorescence for x-ray absorption spectroscopy

A. J. Kropf; R. J. Finch; J. A. Fortner; S. Aase; C. Karanfil; C. U. Segre; J. Terry; G. Bunker; L. D. Chapman

doi:10.1063/1.1618014

Bent silicon crystal in the Laue geometry to resolve x-ray fluorescence for x-ray absorption spectroscopy

A. J. Kropf, R. J. Finch, J. A. Fortner, S. Aase, C. Karanfil, C. U. Segre, J. Terry, G. Bunker, L. D. Chapman

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27 Scopus citations

Abstract

The use of a bent Laue analyzer (BLA) to resolve the L fluorescence x rays of neighboring actinide elements was demonstrated. The adnavtages of a highly bent silicon x-ray analyzer in the Laue geometry were discussed. For small quantities of Np in the presence of U, a large gain in the signal to background ratio was shown. The results show that a bent Laue analyzer with a peak-to-valley ratio of more than 1000:1 extends the useful spectroscopy limits by as much as factor of 100 times.

Original language	English
Pages (from-to)	4696-4702
Number of pages	7
Journal	Review of Scientific Instruments
Volume	74
Issue number	11
DOIs	https://doi.org/10.1063/1.1618014
State	Published - Nov 2003
Externally published	Yes

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title = "Bent silicon crystal in the Laue geometry to resolve x-ray fluorescence for x-ray absorption spectroscopy",

abstract = "The use of a bent Laue analyzer (BLA) to resolve the L fluorescence x rays of neighboring actinide elements was demonstrated. The adnavtages of a highly bent silicon x-ray analyzer in the Laue geometry were discussed. For small quantities of Np in the presence of U, a large gain in the signal to background ratio was shown. The results show that a bent Laue analyzer with a peak-to-valley ratio of more than 1000:1 extends the useful spectroscopy limits by as much as factor of 100 times.",

author = "Kropf, {A. J.} and Finch, {R. J.} and Fortner, {J. A.} and S. Aase and C. Karanfil and Segre, {C. U.} and J. Terry and G. Bunker and Chapman, {L. D.}",

year = "2003",

month = nov,

doi = "10.1063/1.1618014",

language = "English",

volume = "74",

pages = "4696--4702",

journal = "Review of Scientific Instruments",

issn = "0034-6748",

publisher = "American Institute of Physics",

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TY - JOUR

T1 - Bent silicon crystal in the Laue geometry to resolve x-ray fluorescence for x-ray absorption spectroscopy

AU - Kropf, A. J.

AU - Finch, R. J.

AU - Fortner, J. A.

AU - Aase, S.

AU - Karanfil, C.

AU - Segre, C. U.

AU - Terry, J.

AU - Bunker, G.

AU - Chapman, L. D.

PY - 2003/11

Y1 - 2003/11

N2 - The use of a bent Laue analyzer (BLA) to resolve the L fluorescence x rays of neighboring actinide elements was demonstrated. The adnavtages of a highly bent silicon x-ray analyzer in the Laue geometry were discussed. For small quantities of Np in the presence of U, a large gain in the signal to background ratio was shown. The results show that a bent Laue analyzer with a peak-to-valley ratio of more than 1000:1 extends the useful spectroscopy limits by as much as factor of 100 times.

AB - The use of a bent Laue analyzer (BLA) to resolve the L fluorescence x rays of neighboring actinide elements was demonstrated. The adnavtages of a highly bent silicon x-ray analyzer in the Laue geometry were discussed. For small quantities of Np in the presence of U, a large gain in the signal to background ratio was shown. The results show that a bent Laue analyzer with a peak-to-valley ratio of more than 1000:1 extends the useful spectroscopy limits by as much as factor of 100 times.

UR - http://www.scopus.com/inward/record.url?scp=0344946095&partnerID=8YFLogxK

U2 - 10.1063/1.1618014

DO - 10.1063/1.1618014

M3 - Article

AN - SCOPUS:0344946095

SN - 0034-6748

VL - 74

SP - 4696

EP - 4702

JO - Review of Scientific Instruments

JF - Review of Scientific Instruments

IS - 11

ER -

Bent silicon crystal in the Laue geometry to resolve x-ray fluorescence for x-ray absorption spectroscopy

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