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Benefits of Aberration-corrected STEM and EELS in the Study of Nanoscale Materials for Energy and Photonic Applications

  • F. Nan
  • , S. Hosseini Vajargah
  • , D. Rossouw
  • , S. Y. Woo
  • , M. Bugnet
  • , M. C.Y. Chan
  • , N. Gauquelin
  • , S. Stambula
  • , G. Zhu
  • , G. A. Botton

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
Pages (from-to)336-337
Number of pages2
JournalMicroscopy and Microanalysis
Volume18
Issue numberS2
DOIs
StatePublished - Jul 2012
Externally publishedYes

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