@article{1e6a8071ce2a41109a169f42ba1b14d3,
title = "Benefits of Aberration-corrected STEM and EELS in the Study of Nanoscale Materials for Energy and Photonic Applications",
author = "F. Nan and \{Hosseini Vajargah\}, S. and D. Rossouw and Woo, \{S. Y.\} and M. Bugnet and Chan, \{M. C.Y.\} and N. Gauquelin and S. Stambula and G. Zhu and Botton, \{G. A.\}",
year = "2012",
month = jul,
doi = "10.1017/S1431927612003534",
language = "English",
volume = "18",
pages = "336--337",
journal = "Microscopy and Microanalysis",
issn = "1431-9276",
publisher = "Oxford University Press",
number = "S2",
}