Benefits of Aberration-corrected STEM and EELS in the Study of Nanoscale Materials for Energy and Photonic Applications

F. Nan; S. Hosseini Vajargah; D. Rossouw; S. Y. Woo; M. Bugnet; M. C.Y. Chan; N. Gauquelin; S. Stambula; G. Zhu; G. A. Botton

doi:10.1017/S1431927612003534

Benefits of Aberration-corrected STEM and EELS in the Study of Nanoscale Materials for Energy and Photonic Applications

F. Nan, S. Hosseini Vajargah, D. Rossouw, S. Y. Woo, M. Bugnet, M. C.Y. Chan, N. Gauquelin, S. Stambula, G. Zhu, G. A. Botton

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	336-337
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	18
Issue number	S2
DOIs	https://doi.org/10.1017/S1431927612003534
State	Published - Jul 2012
Externally published	Yes

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title = "Benefits of Aberration-corrected STEM and EELS in the Study of Nanoscale Materials for Energy and Photonic Applications",

author = "F. Nan and {Hosseini Vajargah}, S. and D. Rossouw and Woo, {S. Y.} and M. Bugnet and Chan, {M. C.Y.} and N. Gauquelin and S. Stambula and G. Zhu and Botton, {G. A.}",

year = "2012",

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doi = "10.1017/S1431927612003534",

language = "English",

volume = "18",

pages = "336--337",

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TY - JOUR

T1 - Benefits of Aberration-corrected STEM and EELS in the Study of Nanoscale Materials for Energy and Photonic Applications

AU - Nan, F.

AU - Hosseini Vajargah, S.

AU - Rossouw, D.

AU - Woo, S. Y.

AU - Bugnet, M.

AU - Chan, M. C.Y.

AU - Gauquelin, N.

AU - Stambula, S.

AU - Zhu, G.

AU - Botton, G. A.

PY - 2012/7

Y1 - 2012/7

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U2 - 10.1017/S1431927612003534

DO - 10.1017/S1431927612003534

M3 - Article

AN - SCOPUS:85010174748

SN - 1431-9276

VL - 18

SP - 336

EP - 337

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - S2

ER -

Benefits of Aberration-corrected STEM and EELS in the Study of Nanoscale Materials for Energy and Photonic Applications

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