Bend strain tolerance of critical currents for YBa2Cu3O7 films deposited on rolled-textured (001)Ni

C. Park; D. P. Norton; J. D. Budai; D. K. Christen; D. Verebelyi; R. Feenstra; D. F. Lee; A. Goyal; D. M. Kroeger; M. Paranthaman

doi:10.1063/1.122321

Bend strain tolerance of critical currents for YBa₂Cu₃O₇ films deposited on rolled-textured (001)Ni

C. Park, D. P. Norton, J. D. Budai, D. K. Christen, D. Verebelyi, R. Feenstra, D. F. Lee, A. Goyal, D. M. Kroeger, M. Paranthaman

Nanomaterials Chemistry Group

Research output: Contribution to journal › Article › peer-review

47 Scopus citations

Abstract

Superconducting YBa₂Cu₃O₇/CeO₂/YSZ/CeO₂ multilayer structures were grown on rolled-textured (001)Ni using pulsed-laser deposition. Critical current densities greater than 1 MA/cm² were obtained for relatively thick YBa₂Cu₃O₇ films. The compressive and tensile bend strain tolerance of critical currents for the YBa₂Cu₃O₇ films deposited on these rolling-assisted biaxially textured substrates was also determined. These conductors retained up to 80% of their unstrained critical currents for applied compressive bend diameters as small as 1.5 cm and tensile bend diameters of 3.2 cm. The degradation of J_c is caused by the formation and propagation of transverse cracks. The results also suggest a correlation between bend-strain tolerance for these coated conductors and total oxide layer thickness.

Original language	English
Pages (from-to)	1904-1906
Number of pages	3
Journal	Applied Physics Letters
Volume	73
Issue number	13
DOIs	https://doi.org/10.1063/1.122321
State	Published - 1998

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title = "Bend strain tolerance of critical currents for YBa2Cu3O7 films deposited on rolled-textured (001)Ni",

abstract = "Superconducting YBa2Cu3O7/CeO2/YSZ/CeO2 multilayer structures were grown on rolled-textured (001)Ni using pulsed-laser deposition. Critical current densities greater than 1 MA/cm2 were obtained for relatively thick YBa2Cu3O7 films. The compressive and tensile bend strain tolerance of critical currents for the YBa2Cu3O7 films deposited on these rolling-assisted biaxially textured substrates was also determined. These conductors retained up to 80% of their unstrained critical currents for applied compressive bend diameters as small as 1.5 cm and tensile bend diameters of 3.2 cm. The degradation of Jc is caused by the formation and propagation of transverse cracks. The results also suggest a correlation between bend-strain tolerance for these coated conductors and total oxide layer thickness.",

author = "C. Park and Norton, {D. P.} and Budai, {J. D.} and Christen, {D. K.} and D. Verebelyi and R. Feenstra and Lee, {D. F.} and A. Goyal and Kroeger, {D. M.} and M. Paranthaman",

year = "1998",

doi = "10.1063/1.122321",

language = "English",

volume = "73",

pages = "1904--1906",

journal = "Applied Physics Letters",

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TY - JOUR

T1 - Bend strain tolerance of critical currents for YBa2Cu3O7 films deposited on rolled-textured (001)Ni

AU - Park, C.

AU - Norton, D. P.

AU - Budai, J. D.

AU - Christen, D. K.

AU - Verebelyi, D.

AU - Feenstra, R.

AU - Lee, D. F.

AU - Goyal, A.

AU - Kroeger, D. M.

AU - Paranthaman, M.

PY - 1998

Y1 - 1998

N2 - Superconducting YBa2Cu3O7/CeO2/YSZ/CeO2 multilayer structures were grown on rolled-textured (001)Ni using pulsed-laser deposition. Critical current densities greater than 1 MA/cm2 were obtained for relatively thick YBa2Cu3O7 films. The compressive and tensile bend strain tolerance of critical currents for the YBa2Cu3O7 films deposited on these rolling-assisted biaxially textured substrates was also determined. These conductors retained up to 80% of their unstrained critical currents for applied compressive bend diameters as small as 1.5 cm and tensile bend diameters of 3.2 cm. The degradation of Jc is caused by the formation and propagation of transverse cracks. The results also suggest a correlation between bend-strain tolerance for these coated conductors and total oxide layer thickness.

AB - Superconducting YBa2Cu3O7/CeO2/YSZ/CeO2 multilayer structures were grown on rolled-textured (001)Ni using pulsed-laser deposition. Critical current densities greater than 1 MA/cm2 were obtained for relatively thick YBa2Cu3O7 films. The compressive and tensile bend strain tolerance of critical currents for the YBa2Cu3O7 films deposited on these rolling-assisted biaxially textured substrates was also determined. These conductors retained up to 80% of their unstrained critical currents for applied compressive bend diameters as small as 1.5 cm and tensile bend diameters of 3.2 cm. The degradation of Jc is caused by the formation and propagation of transverse cracks. The results also suggest a correlation between bend-strain tolerance for these coated conductors and total oxide layer thickness.

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DO - 10.1063/1.122321

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EP - 1906

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 13

ER -

Bend strain tolerance of critical currents for YBa₂Cu₃O₇ films deposited on rolled-textured (001)Ni

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