Beam profiler for single-photon applications based on compressive sampling techniques

D. Earl, P. Evans, W. Grice, D. S. Guo, T. Humble, E. Martin, R. Pooser

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

We report the development of a low-cost beam characterization technique appropriate for extremely low light levels. The technique makes use of compressive sampling strategies that have been developed recently for imaging applications.

Original languageEnglish
Title of host publication2012 Conference on Lasers and Electro-Optics, CLEO 2012
StatePublished - 2012
Event2012 Conference on Lasers and Electro-Optics, CLEO 2012 - San Jose, CA, United States
Duration: May 6 2012May 11 2012

Publication series

Name2012 Conference on Lasers and Electro-Optics, CLEO 2012

Conference

Conference2012 Conference on Lasers and Electro-Optics, CLEO 2012
Country/TerritoryUnited States
CitySan Jose, CA
Period05/6/1205/11/12

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