Beam profiler for single-photon applications based on compressive sampling techniques

Warren Grice; Duncan Earl; Philip Evans; Dong Sheng Guo; Travis Humble; Eric Martin; Raphael Pooser

doi:10.1364/fio.2012.fw4j.5

Beam profiler for single-photon applications based on compressive sampling techniques

Warren Grice, Duncan Earl, Philip Evans, Dong Sheng Guo, Travis Humble, Eric Martin, Raphael Pooser

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

We report the development of a low-cost beam characterization technique appropriate for extremely low light levels. The technique makes use of compressive sampling strategies that have been developed recently for imaging applications.

Original language	English
Title of host publication	Frontiers in Optics, FIO 2012
Publisher	Optical Society of America (OSA)
ISBN (Print)	9781557529565
DOIs	https://doi.org/10.1364/fio.2012.fw4j.5
State	Published - 2012
Event	Frontiers in Optics, FIO 2012 - Rochester, NY, United States Duration: Oct 14 2012 → Oct 18 2012

Publication series

Name	Frontiers in Optics, FIO 2012

Conference

Conference	Frontiers in Optics, FIO 2012
Country/Territory	United States
City	Rochester, NY
Period	10/14/12 → 10/18/12

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10.1364/fio.2012.fw4j.5

Cite this

@inproceedings{5ea484b400e840b5a2d3872e9d9c148d,

title = "Beam profiler for single-photon applications based on compressive sampling techniques",

abstract = "We report the development of a low-cost beam characterization technique appropriate for extremely low light levels. The technique makes use of compressive sampling strategies that have been developed recently for imaging applications.",

author = "Warren Grice and Duncan Earl and Philip Evans and Guo, {Dong Sheng} and Travis Humble and Eric Martin and Raphael Pooser",

year = "2012",

doi = "10.1364/fio.2012.fw4j.5",

language = "English",

isbn = "9781557529565",

series = "Frontiers in Optics, FIO 2012",

publisher = "Optical Society of America (OSA)",

booktitle = "Frontiers in Optics, FIO 2012",

note = "Frontiers in Optics, FIO 2012 ; Conference date: 14-10-2012 Through 18-10-2012",

}

Grice, W, Earl, D, Evans, P, Guo, DS, Humble, T, Martin, E & Pooser, R 2012, Beam profiler for single-photon applications based on compressive sampling techniques. in Frontiers in Optics, FIO 2012. Frontiers in Optics, FIO 2012, Optical Society of America (OSA), Frontiers in Optics, FIO 2012, Rochester, NY, United States, 10/14/12. https://doi.org/10.1364/fio.2012.fw4j.5

TY - GEN

T1 - Beam profiler for single-photon applications based on compressive sampling techniques

AU - Grice, Warren

AU - Earl, Duncan

AU - Evans, Philip

AU - Guo, Dong Sheng

AU - Humble, Travis

AU - Martin, Eric

AU - Pooser, Raphael

PY - 2012

Y1 - 2012

N2 - We report the development of a low-cost beam characterization technique appropriate for extremely low light levels. The technique makes use of compressive sampling strategies that have been developed recently for imaging applications.

AB - We report the development of a low-cost beam characterization technique appropriate for extremely low light levels. The technique makes use of compressive sampling strategies that have been developed recently for imaging applications.

UR - http://www.scopus.com/inward/record.url?scp=85086613738&partnerID=8YFLogxK

U2 - 10.1364/fio.2012.fw4j.5

DO - 10.1364/fio.2012.fw4j.5

M3 - Conference contribution

AN - SCOPUS:85086613738

SN - 9781557529565

T3 - Frontiers in Optics, FIO 2012

BT - Frontiers in Optics, FIO 2012

PB - Optical Society of America (OSA)

T2 - Frontiers in Optics, FIO 2012

Y2 - 14 October 2012 through 18 October 2012

ER -

Beam profiler for single-photon applications based on compressive sampling techniques

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