Beam profiler for single-photon applications based on compressive sampling techniques

D. Earl, P. Evans, W. Grice, D. S. Guo, T. Humble, E. Martin, R. Pooser

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

We report the development of a low-cost beam characterization technique appropriate for extremely low light levels. The technique makes use of compressive sampling strategies that have been developed recently for imaging applications.

Original languageEnglish
Title of host publicationQuantum Electronics and Laser Science Conference, QELS 2012
StatePublished - 2012
EventQuantum Electronics and Laser Science Conference, QELS 2012 - San Jose, CA, United States
Duration: May 6 2012May 11 2012

Publication series

NameOptics InfoBase Conference Papers
ISSN (Electronic)2162-2701

Conference

ConferenceQuantum Electronics and Laser Science Conference, QELS 2012
Country/TerritoryUnited States
CitySan Jose, CA
Period05/6/1205/11/12

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