Abstract
This work reports synthesis, characterization and integration of sub-micron thick nano-grained barium titanate films on organic Printed Wiring Boards (PWB). Barium titanate films were synthesized on titanium foils at 95°C. SEM of films revealed 80 nm grains. The films were characterized using XRD, FTIR and Raman spectroscopy. As-synthesized films exhibited high capacitance densities and dielectric loss. The films were treated with oxygen plasma to reduce entrapped hydroxyl groups and this resulted in improved dielectric properties. The plasma treated films exhibited a capacitance density of 1 μ F/cm2 and a dielectric loss of 0.06. The high frequency dielectric properties were extracted from s-parameter measurements on CPW structures on these films and were found to be stable up to 8 GHz.
| Original language | English |
|---|---|
| Pages (from-to) | 95-100 |
| Number of pages | 6 |
| Journal | Journal of Electroceramics |
| Volume | 13 |
| Issue number | 1-3 |
| DOIs | |
| State | Published - Jul 2004 |
Funding
This work was supported by the National Science Foundation (NSF) through the NSF ERC in Electronic Packaging (EEC-9402723) at Georgia Institute of Technology. Raman spectroscopy work was supported by Division of Materials Sciences and Engineering, U.S. Department of Energy, under Contract DE-AC05-00OR22725 with UT-Battelle, LLC.
Keywords
- Barium titanate
- Decoupling
- Dielectric constant
- Embedded capacitors
- FTIR
- High frequency
- PWB
- Raman