Automated piezoresponse force microscopy domain tracking during fast thermally stimulated phase transition in CuInP2S6

M. Checa; K. P. Kelley; R. Vasudevan; L. Collins; S. Jesse

doi:10.1088/1361-6528/acd34d

Automated piezoresponse force microscopy domain tracking during fast thermally stimulated phase transition in CuInP₂S₆

M. Checa, K. P. Kelley, R. Vasudevan, L. Collins, S. Jesse

Research output: Contribution to journal › Article › peer-review

5 Scopus citations

Abstract

Real-time tracking of dynamic nanoscale processes such as phase transitions by scanning probe microscopy is a challenging task, typically requiring extensive and laborious human supervision. Smart strategies to track specific regions of interest (ROI) in the system during such transformations in a fast and automated manner are necessary to study the evolution of the microscopic changes in such dynamic systems. In this work, we realize automated ROI tracking in piezoresponse force microscopy during a fast (≈0.8 °C s⁻¹) thermally stimulated ferroelectric-to-paraelectric phase transition in CuInP₂S₆. We use a combination of fast (1 frame per second) sparse scanning with compressed sensing image reconstruction and real-time offset correction via phase cross correlation. The applied methodology enables in situ fast and automated functional nanoscale characterization of a certain ROI during external stimulation that generates sample drift and changes local functionality.

Original language	English
Article number	325703
Journal	Nanotechnology
Volume	34
Issue number	32
DOIs	https://doi.org/10.1088/1361-6528/acd34d
State	Published - Aug 6 2023

Funding

Notice: This manuscript has been authored by UT-Battelle, LLC, under contract DE-AC05-00OR22725 with the US Department of Energy (DOE). The United States Government retains and the publisher, by accepting the article for publication, acknowledges that the United States Government retains a nonexclusive, paid-up, irrevocable, worldwide license to publish or reproduce the published form of this manuscript, or allow others to do so, for the United States Government purposes. The Department of Energy will provide public access to these results of federally sponsored research in accordance with the DOE Public Access Plan ( http://energy.gov/downloads/doe-public-access-plan ). The research was supported by the Center for Nanophase Materials Sciences, (CNMS), which is a US Department of Energy, Office of Science User Facility at Oak Ridge National Laboratory. This manuscript has been authored by UT-Battelle, LLC, under Contract No. DEAC0500OR22725 with the US Department of Energy.

Funders	Funder number
Center for Nanophase Materials Sciences
U.S. Department of Energy
Office of Science
Oak Ridge National Laboratory	DE-AC05-00OR22725

Keywords

ROI tracking
atomic force microscopy
compressed sensing
phase cross correlation
piezoresponse force microscopy
spiral scan

Access to Document

10.1088/1361-6528/acd34d

Cite this

@article{22fe0b88435543a5899f95e88c5271a6,

title = "Automated piezoresponse force microscopy domain tracking during fast thermally stimulated phase transition in CuInP2S6",

abstract = "Real-time tracking of dynamic nanoscale processes such as phase transitions by scanning probe microscopy is a challenging task, typically requiring extensive and laborious human supervision. Smart strategies to track specific regions of interest (ROI) in the system during such transformations in a fast and automated manner are necessary to study the evolution of the microscopic changes in such dynamic systems. In this work, we realize automated ROI tracking in piezoresponse force microscopy during a fast (≈0.8 °C s−1) thermally stimulated ferroelectric-to-paraelectric phase transition in CuInP2S6. We use a combination of fast (1 frame per second) sparse scanning with compressed sensing image reconstruction and real-time offset correction via phase cross correlation. The applied methodology enables in situ fast and automated functional nanoscale characterization of a certain ROI during external stimulation that generates sample drift and changes local functionality.",

keywords = "ROI tracking, atomic force microscopy, compressed sensing, phase cross correlation, piezoresponse force microscopy, spiral scan",

author = "M. Checa and Kelley, {K. P.} and R. Vasudevan and L. Collins and S. Jesse",

note = "Publisher Copyright: {\textcopyright} 2023 The Author(s). Published by IOP Publishing Ltd.",

year = "2023",

month = aug,

day = "6",

doi = "10.1088/1361-6528/acd34d",

language = "English",

volume = "34",

journal = "Nanotechnology",

issn = "0957-4484",

publisher = "IOP Publishing",

number = "32",

}

TY - JOUR

T1 - Automated piezoresponse force microscopy domain tracking during fast thermally stimulated phase transition in CuInP2S6

AU - Checa, M.

AU - Kelley, K. P.

AU - Vasudevan, R.

AU - Collins, L.

AU - Jesse, S.

PY - 2023/8/6

Y1 - 2023/8/6

N2 - Real-time tracking of dynamic nanoscale processes such as phase transitions by scanning probe microscopy is a challenging task, typically requiring extensive and laborious human supervision. Smart strategies to track specific regions of interest (ROI) in the system during such transformations in a fast and automated manner are necessary to study the evolution of the microscopic changes in such dynamic systems. In this work, we realize automated ROI tracking in piezoresponse force microscopy during a fast (≈0.8 °C s−1) thermally stimulated ferroelectric-to-paraelectric phase transition in CuInP2S6. We use a combination of fast (1 frame per second) sparse scanning with compressed sensing image reconstruction and real-time offset correction via phase cross correlation. The applied methodology enables in situ fast and automated functional nanoscale characterization of a certain ROI during external stimulation that generates sample drift and changes local functionality.

AB - Real-time tracking of dynamic nanoscale processes such as phase transitions by scanning probe microscopy is a challenging task, typically requiring extensive and laborious human supervision. Smart strategies to track specific regions of interest (ROI) in the system during such transformations in a fast and automated manner are necessary to study the evolution of the microscopic changes in such dynamic systems. In this work, we realize automated ROI tracking in piezoresponse force microscopy during a fast (≈0.8 °C s−1) thermally stimulated ferroelectric-to-paraelectric phase transition in CuInP2S6. We use a combination of fast (1 frame per second) sparse scanning with compressed sensing image reconstruction and real-time offset correction via phase cross correlation. The applied methodology enables in situ fast and automated functional nanoscale characterization of a certain ROI during external stimulation that generates sample drift and changes local functionality.

KW - ROI tracking

KW - atomic force microscopy

KW - compressed sensing

KW - phase cross correlation

KW - piezoresponse force microscopy

KW - spiral scan

UR - http://www.scopus.com/inward/record.url?scp=85160299378&partnerID=8YFLogxK

U2 - 10.1088/1361-6528/acd34d

DO - 10.1088/1361-6528/acd34d

M3 - Article

AN - SCOPUS:85160299378

SN - 0957-4484

VL - 34

JO - Nanotechnology

JF - Nanotechnology

IS - 32

M1 - 325703

ER -