TY - JOUR
T1 - AutoDisk
T2 - Automated diffraction processing and strain mapping in 4D-STEM
AU - Wang, Sihan
AU - Eldred, Tim B.
AU - Smith, Jacob G.
AU - Gao, Wenpei
N1 - Publisher Copyright:
© 2022
PY - 2022/6
Y1 - 2022/6
N2 - Development in lattice strain mapping using four-dimensional scanning transmission electron microscopy (4D-STEM) method now offers improved precision and feasibility. However, automatic and accurate diffraction analysis is still challenging due to noise and the complexity of intensity in diffraction patterns. In this work, we demonstrate an approach, employing the blob detection on cross-correlated diffraction patterns followed by a lattice fitting algorithm, to automate the processing of four-dimensional data, including identifying and locating disks, and extracting local lattice parameters without prior knowledge about the material. The approach is both tested using simulated diffraction patterns and applied on experimental data acquired from a Pd@Pt core-shell nanoparticle. Our method shows robustness against various sample thicknesses and high noise, capability to handle complex patterns, and picometer-scale accuracy in strain measurement, making it a promising tool for high-throughput 4D-STEM data processing.
AB - Development in lattice strain mapping using four-dimensional scanning transmission electron microscopy (4D-STEM) method now offers improved precision and feasibility. However, automatic and accurate diffraction analysis is still challenging due to noise and the complexity of intensity in diffraction patterns. In this work, we demonstrate an approach, employing the blob detection on cross-correlated diffraction patterns followed by a lattice fitting algorithm, to automate the processing of four-dimensional data, including identifying and locating disks, and extracting local lattice parameters without prior knowledge about the material. The approach is both tested using simulated diffraction patterns and applied on experimental data acquired from a Pd@Pt core-shell nanoparticle. Our method shows robustness against various sample thicknesses and high noise, capability to handle complex patterns, and picometer-scale accuracy in strain measurement, making it a promising tool for high-throughput 4D-STEM data processing.
UR - http://www.scopus.com/inward/record.url?scp=85126104862&partnerID=8YFLogxK
U2 - 10.1016/j.ultramic.2022.113513
DO - 10.1016/j.ultramic.2022.113513
M3 - Article
C2 - 35290793
AN - SCOPUS:85126104862
SN - 0304-3991
VL - 236
JO - Ultramicroscopy
JF - Ultramicroscopy
M1 - 113513
ER -