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Atomistic Probing of Defect-Engineered 2H-MoTe
2
Monolayers
Odongo Francis Ngome Okello
, Dong Hwan Yang
, Seung Young Seo
,
Jewook Park
, Gunho Moon
,
Dongwon Shin
, Yu Seong Chu
, Sejung Yang
, Teruyasu Mizoguchi
, Moon Ho Jo
, Si Young Choi
Multiscale Modeling & Materials by Desig
Research output
:
Contribution to journal
›
Article
›
peer-review
9
Scopus citations
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2
Monolayers'. Together they form a unique fingerprint.
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Material Science
Monolayers
100%
Point Defect
100%
Two-Dimensional Material
60%
Annealing
40%