Atomically resolved mapping of polarization and electric fields across ferroelectric/oxide interfaces by z-contrast imaging

Hye Jung Chang; Sergei V. Kalinin; Anna N. Morozovska; Mark Huijben; Ying Hao Chu; Pu Yu; Ramamoorthy Ramesh; Evgeny A. Eliseev; George S. Svechnikov; Stephen J. Pennycook; Albina Y. Borisevich

doi:10.1002/adma.201004641

Atomically resolved mapping of polarization and electric fields across ferroelectric/oxide interfaces by z-contrast imaging

Hye Jung Chang
, Sergei V. Kalinin
, Anna N. Morozovska
, Mark Huijben
, Ying Hao Chu
, Pu Yu
, Ramamoorthy Ramesh
, Evgeny A. Eliseev
, George S. Svechnikov
, Stephen J. Pennycook
, Albina Y. Borisevich

electron Microscopy and Microanalysis

Research output: Contribution to journal › Article › peer-review

76 Scopus citations

Abstract

Direct atomic displacement mapping at ferroelectric interfaces by aberration corrected scanning transmission electron microscopy(STEM) (a STEM image, b corresponding displacement profile) is combined with Landau Ginsburg Devonshire theory to obtain the complete interface electrostatics in real space, including separate estimates for the polarization and intrinsic interface charge contributions.

Original language	English
Pages (from-to)	2474-2479
Number of pages	6
Journal	Advanced Materials
Volume	23
Issue number	21
DOIs	https://doi.org/10.1002/adma.201004641
State	Published - Jun 3 2011

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Chang, H. J., Kalinin, S. V., Morozovska, A. N., Huijben, M., Chu, Y. H., Yu, P., Ramesh, R., Eliseev, E. A., Svechnikov, G. S., Pennycook, S. J., & Borisevich, A. Y. (2011). Atomically resolved mapping of polarization and electric fields across ferroelectric/oxide interfaces by z-contrast imaging. Advanced Materials, 23(21), 2474-2479. https://doi.org/10.1002/adma.201004641

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title = "Atomically resolved mapping of polarization and electric fields across ferroelectric/oxide interfaces by z-contrast imaging",

abstract = "Direct atomic displacement mapping at ferroelectric interfaces by aberration corrected scanning transmission electron microscopy(STEM) (a STEM image, b corresponding displacement profile) is combined with Landau Ginsburg Devonshire theory to obtain the complete interface electrostatics in real space, including separate estimates for the polarization and intrinsic interface charge contributions.",

author = "Chang, \{Hye Jung\} and Kalinin, \{Sergei V.\} and Morozovska, \{Anna N.\} and Mark Huijben and Chu, \{Ying Hao\} and Pu Yu and Ramamoorthy Ramesh and Eliseev, \{Evgeny A.\} and Svechnikov, \{George S.\} and Pennycook, \{Stephen J.\} and Borisevich, \{Albina Y.\}",

year = "2011",

month = jun,

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doi = "10.1002/adma.201004641",

language = "English",

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pages = "2474--2479",

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T1 - Atomically resolved mapping of polarization and electric fields across ferroelectric/oxide interfaces by z-contrast imaging

AU - Chang, Hye Jung

AU - Kalinin, Sergei V.

AU - Morozovska, Anna N.

AU - Huijben, Mark

AU - Chu, Ying Hao

AU - Yu, Pu

AU - Ramesh, Ramamoorthy

AU - Eliseev, Evgeny A.

AU - Svechnikov, George S.

AU - Pennycook, Stephen J.

AU - Borisevich, Albina Y.

PY - 2011/6/3

Y1 - 2011/6/3

N2 - Direct atomic displacement mapping at ferroelectric interfaces by aberration corrected scanning transmission electron microscopy(STEM) (a STEM image, b corresponding displacement profile) is combined with Landau Ginsburg Devonshire theory to obtain the complete interface electrostatics in real space, including separate estimates for the polarization and intrinsic interface charge contributions.

AB - Direct atomic displacement mapping at ferroelectric interfaces by aberration corrected scanning transmission electron microscopy(STEM) (a STEM image, b corresponding displacement profile) is combined with Landau Ginsburg Devonshire theory to obtain the complete interface electrostatics in real space, including separate estimates for the polarization and intrinsic interface charge contributions.

UR - https://www.scopus.com/pages/publications/79957833852

U2 - 10.1002/adma.201004641

DO - 10.1002/adma.201004641

M3 - Article

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AN - SCOPUS:79957833852

SN - 0935-9648

VL - 23

SP - 2474

EP - 2479

JO - Advanced Materials

JF - Advanced Materials

IS - 21

ER -

Atomically resolved mapping of polarization and electric fields across ferroelectric/oxide interfaces by z-contrast imaging

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