Atomic scale investigations of ferroelectricity in perovskite thin films

M. F. Chisholm; H. N. Lee; K. Van Benthem

doi:10.1109/ISAF.2008.4693925

Atomic scale investigations of ferroelectricity in perovskite thin films

M. F. Chisholm, H. N. Lee, K. Van Benthem

Materials Science and Technology Div

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Original language	English
Title of host publication	17th IEEE International Symposium on the Applications of Ferroelectrics, ISAF 2008
DOIs	https://doi.org/10.1109/ISAF.2008.4693925
State	Published - 2008
Event	17th IEEE International Symposium on the Applications of Ferroelectrics, ISAF 2008 - Santa Fe, NM, United States Duration: Feb 23 2008 → Feb 28 2008

Publication series

Name	IEEE International Symposium on Applications of Ferroelectrics
Volume	1

Conference

Conference	17th IEEE International Symposium on the Applications of Ferroelectrics, ISAF 2008
Country/Territory	United States
City	Santa Fe, NM
Period	02/23/08 → 02/28/08

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10.1109/ISAF.2008.4693925

Cite this

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title = "Atomic scale investigations of ferroelectricity in perovskite thin films",

author = "Chisholm, {M. F.} and Lee, {H. N.} and {Van Benthem}, K.",

year = "2008",

doi = "10.1109/ISAF.2008.4693925",

language = "English",

isbn = "1424427444",

series = "IEEE International Symposium on Applications of Ferroelectrics",

booktitle = "17th IEEE International Symposium on the Applications of Ferroelectrics, ISAF 2008",

note = "17th IEEE International Symposium on the Applications of Ferroelectrics, ISAF 2008 ; Conference date: 23-02-2008 Through 28-02-2008",

}

Chisholm, MF, Lee, HN & Van Benthem, K 2008, Atomic scale investigations of ferroelectricity in perovskite thin films. in 17th IEEE International Symposium on the Applications of Ferroelectrics, ISAF 2008., 4693925, IEEE International Symposium on Applications of Ferroelectrics, vol. 1, 17th IEEE International Symposium on the Applications of Ferroelectrics, ISAF 2008, Santa Fe, NM, United States, 02/23/08. https://doi.org/10.1109/ISAF.2008.4693925

Atomic scale investigations of ferroelectricity in perovskite thin films. / Chisholm, M. F.; Lee, H. N.; Van Benthem, K.
17th IEEE International Symposium on the Applications of Ferroelectrics, ISAF 2008. 2008. 4693925 (IEEE International Symposium on Applications of Ferroelectrics; Vol. 1).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Atomic scale investigations of ferroelectricity in perovskite thin films

AU - Chisholm, M. F.

AU - Lee, H. N.

AU - Van Benthem, K.

PY - 2008

Y1 - 2008

UR - http://www.scopus.com/inward/record.url?scp=58149486656&partnerID=8YFLogxK

U2 - 10.1109/ISAF.2008.4693925

DO - 10.1109/ISAF.2008.4693925

M3 - Conference contribution

AN - SCOPUS:58149486656

SN - 1424427444

SN - 9781424427444

T3 - IEEE International Symposium on Applications of Ferroelectrics

BT - 17th IEEE International Symposium on the Applications of Ferroelectrics, ISAF 2008

T2 - 17th IEEE International Symposium on the Applications of Ferroelectrics, ISAF 2008

Y2 - 23 February 2008 through 28 February 2008

ER -

Atomic scale investigations of ferroelectricity in perovskite thin films

Publication series

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