| Original language | English |
|---|---|
| Pages (from-to) | 436-437 |
| Number of pages | 2 |
| Journal | Microscopy and Microanalysis |
| Volume | 15 |
| Issue number | SUPPL. 2 |
| DOIs | |
| State | Published - Jul 2009 |
Funding
References [1] S.A. Wolf, D.D. Awschalom, R.A. Buhrman, J. Daughton, S. von Molnar, M.L. Roukes, A.y. Chtchelkanova and D.M. Treger, Science, 294 (2001), 1488. [2] T.C. Kaspar, T. Droubay, Y. Li, S.M. Heald, P. Nachimuthu, C.M. Wang, V. Shutthanadan, C.A. Johnson, D.R. Gamelin and S.A. Chambers, New J. Physics, 10 (2008), 055010. [3] K.R. Kittilstved, D.A. Schwartz, A.C. Tuan, S.M. Heald, S.A. Chambers and D.R. Gamelin, Phys. Rev. Lett., 97 (2006), 037203. [4] T.C. Kaspar, T. Droubay, S.M. Heald, M.H. Engelhard, P. Nachimuthu and S.A. Chambers, Physical Review B, 77 (2008), 201303(R). [6] This work was carried out in part at the National Centre for Electron Microscopy, under the auspices of the U.S. Department of Energy under contract number DE-AC02-05CH11231.