Atomic-resolution EELS in aberration-corrected STEM

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1 Scopus citations

Original language	English
Pages (from-to)	852-853
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	9
Issue number	SUPPL. 2
DOIs	https://doi.org/10.1017/s1431927603444267
State	Published - 2003

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@article{403db9874a3c4dd781a37048fc217b14,

title = "Atomic-resolution EELS in aberration-corrected STEM",

author = "Findlay, \{S. D.\} and Oxley, \{M. P.\} and Allen, \{L. J.\} and Lupini, \{A. R.\} and Pennycook, \{S. J.\}",

year = "2003",

doi = "10.1017/s1431927603444267",

language = "English",

volume = "9",

pages = "852--853",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Oxford University Press",

number = "SUPPL. 2",

}

TY - JOUR

T1 - Atomic-resolution EELS in aberration-corrected STEM

AU - Findlay, S. D.

AU - Oxley, M. P.

AU - Allen, L. J.

AU - Lupini, A. R.

AU - Pennycook, S. J.

PY - 2003

Y1 - 2003

UR - https://www.scopus.com/pages/publications/0042922823

U2 - 10.1017/s1431927603444267

DO - 10.1017/s1431927603444267

M3 - Article

AN - SCOPUS:0042922823

SN - 1431-9276

VL - 9

SP - 852

EP - 853

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - SUPPL. 2

ER -