| Original language | English |
|---|---|
| Pages (from-to) | 852-853 |
| Number of pages | 2 |
| Journal | Microscopy and Microanalysis |
| Volume | 9 |
| Issue number | SUPPL. 2 |
| DOIs | |
| State | Published - 2003 |
Atomic-resolution EELS in aberration-corrected STEM
S. D. Findlay, M. P. Oxley, L. J. Allen, A. R. Lupini, S. J. Pennycook
Research output: Contribution to journal › Article › peer-review
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