Atomic-resolution EELS in aberration-corrected STEM

S. D. Findlay, M. P. Oxley, L. J. Allen, A. R. Lupini, S. J. Pennycook

Research output: Contribution to journal › Article › peer-review

1 Scopus citations

Original language	English
Pages (from-to)	852-853
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	9
Issue number	SUPPL. 2
DOIs	https://doi.org/10.1017/s1431927603444267
State	Published - 2003

Access to Document

@article{403db9874a3c4dd781a37048fc217b14,

title = "Atomic-resolution EELS in aberration-corrected STEM",

author = "Findlay, {S. D.} and Oxley, {M. P.} and Allen, {L. J.} and Lupini, {A. R.} and Pennycook, {S. J.}",

year = "2003",

doi = "10.1017/s1431927603444267",

language = "English",

volume = "9",

pages = "852--853",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Oxford University Press",

number = "SUPPL. 2",

}

TY - JOUR

T1 - Atomic-resolution EELS in aberration-corrected STEM

AU - Findlay, S. D.

AU - Oxley, M. P.

AU - Allen, L. J.

AU - Lupini, A. R.

AU - Pennycook, S. J.

PY - 2003

Y1 - 2003

UR - http://www.scopus.com/inward/record.url?scp=0042922823&partnerID=8YFLogxK

U2 - 10.1017/s1431927603444267

DO - 10.1017/s1431927603444267

M3 - Article

AN - SCOPUS:0042922823

SN - 1431-9276

VL - 9

SP - 852

EP - 853

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - SUPPL. 2

ER -