Abstract
Cryogenic four-dimensional scanning transmission electron microscopy (4D-STEM) imaging is a useful technique for studying quantum materials and their interfaces by simultaneously probing charge, lattice, spin, and chemistry on the atomic scale with the sample held at temperatures ranging from room to cryogenic. However, its applications are currently limited by the instabilities of cryo-stages and electronics. To overcome this challenge, we develop an algorithm to effectively correct the complex distortions present in atomic resolution cryogenic 4D-STEM data sets. This method uses nonrigid registration to identify localized distortions in a 4D-STEM and relate them to an undistorted experimental STEM image, followed by a series of affine transformations for distortion corrections. This method allows a minimum loss of information in both reciprocal and real spaces, enabling the reconstruction of sample information from 4D-STEM data sets. This method is computationally cheap, fast, and applicable for on-the-fly data analysis in future in situ cryogenic 4D-STEM experiments.
| Original language | English |
|---|---|
| Pages (from-to) | 11327-11334 |
| Number of pages | 8 |
| Journal | ACS Nano |
| Volume | 17 |
| Issue number | 12 |
| DOIs | |
| State | Published - Jun 27 2023 |
Funding
This work was supported by the U.S. Department of Energy, Office of Basic Energy Sciences, Division of Materials Sciences and Engineering, and initiated within a DOE-BES early career award No. ERKCZ55. Algorithm development was supported by the Advanced Scientific Computing Research (ASCR) program under the U.S. DOE Office of Science. Electron microscopy was performed at Oak Ridge National Laboratory’s Center for Nanophase Materials Sciences (CNMS), a US DOE Office of Science User Facility. We thank C. Ophus for valuable discussions.
Keywords
- 4D-STEM
- Affine transformations
- Cryogenic
- Distortion Correction
- Transmission Electron Microscopy
- Triangularization