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Atomic Lock-on: In Situ Picometer Precise Beam Placement in the Scanning Transmission Electron Microscope

Research output: Contribution to journalConference articlepeer-review

Original languageEnglish
Pages (from-to)422
Number of pages1
JournalMicroscopy and Microanalysis
Volume30
Issue number2024
DOIs
StatePublished - Jul 24 2024
Event82nd Annual Meeting Microscopy Society of America and the 58th Annual Meeting Microanalysis Society, M and M 2024 - Cleveland, United States
Duration: Jul 28 2024Aug 1 2024

Funding

STEM beam control work was supported by Center for Nanophase Materials Sciences (CNMS), which is a US Department of Energy, Office of Science User Facility at Oak Ridge National Laboratory.

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