Atomic layer engineering of perovskite oxides for chemically sharp heterointerfaces

Woo Seok Choi, Christopher M. Rouleau, Sung Seok A. Seo, Zhenlin Luo, Hua Zhou, Timothy T. Fister, Jeffrey A. Eastman, Paul H. Fuoss, Dillon D. Fong, Jonathan Z. Tischler, Gyula Eres, Matthew F. Chisholm, Ho Nyung Lee

Research output: Contribution to journalArticlepeer-review

51 Scopus citations

Abstract

Atomic layer engineering enables fabrication of a chemically sharp oxide heterointerface. The interface formation and strain evolution during the initial growth of LaAlO3/SrTiO3 heterostructures by pulsed laser deposition are investigated in search of a means for controlling the atomic-sharpness of the interface. This study shows that inserting a monolayer of LaAlO3 grown at high oxygen pressure dramatically enhances interface abruptness.

Original languageEnglish
Pages (from-to)6423-6428
Number of pages6
JournalAdvanced Materials
Volume24
Issue number48
DOIs
StatePublished - Dec 18 2012

Keywords

  • LaAlO /SrTiO
  • atomic layer engineering
  • epitaxial strain
  • perovskite oxide interface
  • pulsed laser deposition

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