Fingerprint
Dive into the research topics of 'Atomic layer deposition TiO2-Al2O3 stack: An improved gate dielectric on Ga-polar GaN metal oxide semiconductor capacitors'. Together they form a unique fingerprint.- Sort by
- Weight
- Alphabetically
Daming Wei, James H. Edgar, Dayrl P. Briggs, Scott T. Retterer, Bernadeta Srijanto, Dale K. Hensley, Harry M. Meyer
Research output: Contribution to journal › Article › peer-review