Atomic layer-by-layer surface removal by force microscopy

Using an atomic force microscope (AFM) operating under ambient conditions, we have obtained the first atomic resolution AFM images of atomic-scale defects and have observed the scanning induced removal of atoms from lead pyrophosphate cleavage faces. Repeated scanning of the same surface area revealed cyclic changes in the Pb₂P₂O₇ atomic structure consistent with a layer-by-layer removal of atoms. Subsequent large area imaging of a region that had been subjected to repeated scanning revealed a depression several nanometers deep, including that this technique may be applicable to patterning the surfaces of materials on an atomic scale.